|
Reliable and economical method to
join optical tables.
S.C. Corzo-Garcia, R.J. Medina-Lopez, S. Anderson, E. Castro-Camus,
R. Carriles and A. Ruiz-Marquez.
OPTICS AND LASERS IN ENGINEERING In Press, (2011).
[ PDF | Abstract | DOI ]
|
|
Optical absorption spectroscopy of one-dimensional silicon nanostructures.
N. Arzate, RA. Vazquez-Nava, JL. Cabellos, R. Carriles, E. Castro-Camus, ME. Figueroa-Delgadillo, BS. Mendoza.
OPTICS AND LASERS IN ENGINEERING 49, 668 (2011).
[ PDF | Abstract | DOI ]
|
|
Optimizing the fluorescent yield in two-photon laser scanning microscopy with dispersion compensation.
JJ. Field, R. Carriles, KE. Sheetz, EV. Chandler, EE. Hoover, SE. Tillo, TE. Hughes, AW. Sylvester, D. Kleinfeld, JA. Squier.
OPTICS EXPRESS 18, 13661 (2010).
[ PDF | Abstract | DOI ]
|
|
Invited Review Article: Imaging techniques for harmonic and multiphoton absorption fluorescence microscopy.
R. Carriles, DN. Schafer, KE. Sheetz, JJ. Field, R. Cisek, V. Barzda, AW. Sylvester, JA. Squier.
REVIEW OF SCIENTIFIC INSTRUMENTS 80, 081101 (2009).
[ PDF | Abstract | DOI ]
|
|
High-resolution mosaic imaging with multifocal, multiphoton photon-counting microscopy.
E. Chandler, E. Hoover, J. Field, K. Sheetz, W. Amir, R. Carriles, SY. Ding, J. Squier.
APPLIED OPTICS 48, 2067 (2009).
[ PDF | Abstract | DOI ]
|
|
Advancing multifocal nonlinear microscopy: development and application of a novel multibeam Yb:KGd(WO4)(2) oscillator.
KE. Sheetz, EE. Hoover, R. Carriles, D. Kleinfeld, JA. Squier.
OPTICS EXPRESS 16, 17574 (2008).
[ PDF | Abstract | DOI ]
|
|
Simultaneous multifocal, multiphoton, photon counting microscopy.
R. Carriles, KE. Sheetz, EE. Hoover, JA. Squier, V. Barzda.
OPTICS EXPRESS 16, 10364 (2008).
[ PDF | Abstract | DOI ]
|
|
Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions.
K. Wu, R. Carriles, MC. Downer.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS 24, 2736 (2007).
[ PDF | Abstract | DOI ]
|
|
Simultaneous imaging of multiple focal planes using a two-photon scanning microscope.
W. Amir, R. Carriles, EE. Hoover, TA. Planchon, CG. Durfee, JA. Squier.
OPTICS LETTERS 32, 1731 (2007).
[ PDF | Abstract | DOI ]
|
|
Absolute phase and amplitude of second-order nonlinear optical susceptibility components at Si(001) interfaces.
YQ. An, R. Carriles, MC. Downer.
PHYSICAL REVIEW B 75, 241307 (2007).
[ PDF | Abstract | DOI ]
|
|
Optical characterization of process-dependent charging in hafnium oxide structures.
R. Carriles, J. Kwon, YQ. An, L. Sun, SK. Stanley, JG. Ekerdt, MC. Downer, J. Price, T. Boescke, AC. Diebold.
JOURNAL OF VACUUM SCIENCE \& TECHNOLOGY B 24, 2160 (2006).
[ PDF | Abstract | DOI ]
|
|
Second-harmonic generation from Si/SiO2/Hf(1-x)SixO2 structures.
R. Carriles, J. Kwon, YQ. An, JC. Miller, MC. Downer, J. Price, AC. Diebold.
APPLIED PHYSICS LETTERS 88, 161120 (2006).
[ PDF | Abstract | DOI ]
|
|
Frequency-domain measurement of second harmonic phase.
R. Carriles, YQ. An, MC. Downer.
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 242, 3001 (2005).
[ PDF | Abstract | DOI ]
|
|
Second-harmonic amplitude and phase spectroscopy by use of broad-bandwidth femtosecond pulses.
PT. Wilson, Y. Jiang, R. Carriles, MC. Downer.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS 20, 2548 (2003).
[ PDF | Abstract | DOI ]
|